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NDT Equipment and Accessories
Integrated Inspection Systems
Bar Inspection Systems
Bar inspection system using ultrasonic phased array, eddy current array and X-ray fluorescence spectroscopy technologies.
Rotating Billet Inspection System (RBIS)
In order to inspect round, large-diameter billets, Olympus has developed high-speed inspection systems,which reach the highest quality standard without any compromise to productivity.
FOX-IQ
The FOX-IQ XRF system performs fully automated online analysis for 100% high-volume process control. X-Ray Fluorescence (XRF) is a proven analytical technique commonly used to quickly and nondetructively verify alloy grade and chemistry.
Bar Inspection System (BIS)
The BIS can combine phased array (PA) and eddy current array (ECA) technologies to inspect the full volume and the full surface of round and square bars.
